Instrumentation

Agilent E4360 Modular Solar Array Simulator
Agilent recently introduced the Agilent E4360 modular solar array simulator. Packed in a compact 2U high package, the new solar [...]
- May 8, 2008
Precision Waveform Analyzer - Agilent 86108A
Agilent announced the 86108A precision waveform analyzer, designed for engineers involved in design verification and validation of high-speed electrical [...]
- February 4, 2008

Microwave Analog Signal Generator - Agilent N5183A MXG
Agilent announced the N5183A MXG Compact Microwave Analog Signal Generator, providing frequency coverage up to 20, 32 or 40 GHz. [...]
- February 4, 2008
IPTV Test Option for QuickTest 100 ADSL2+ Tester - Vonaq
Vonaq announced the launch of its IPTV Test Option for the QuickTest 100 ADSL2+ Tester, a handheld diagnostic tool which [...]
- January 19, 2008
Handheld ADSL Tester - GAO2045
GAO Tek announced its new GAO2045 handheld ADSL Tester. This measurement device provides a highly simplified process: operators need simply [...]
- October 22, 2007
Keithley Models 2635 and 2636 Instruments for Semiconductor Parametric Analysis and Testing
Keithley Instruments announced its new instrumentation devices for semiconductor parametric analysis and testing. The new Models 2635 and Model 2636 [...]
- September 16, 2007
Altera Plug & Play Signal Integrity for Stratix II GX FPGA
Altera introduced its Plug & Play Signal Integrity technology, which redefines FPGA use in high-performance systems by enabling a single [...]
- September 12, 2007
Elma Advanced Mezzanine Card (AMC) Load Board for Testing MicroTCA Systems
Elma has released a new Advanced Mezzanine Card (AMC) Load Board for testing the cooling and power of MicroTCA [...]
- September 4, 2007
ETSerdes Embedded SerDes Test Solution - LogicVision
LogicVision introduced the ETSerdes, a new release of its Embedded SerDes test solution. The new release provides more accurate measurements [...]
- September 4, 2007
Agilent U7231A DDR3 Compliance Test Application for Infiniium Oscilloscopes
Agilent introduced the U7231A DDR3 Compliance Test Application for Infiniium 54850 and 80000 Series Oscilloscopes. This application features Advanced [...]
- August 31, 2007
M-122 Mini Translation Stage - Physik Instrumente
Physik Instrumente (PI) has introduced its M-122 Mini Translation Stage. The M-122 features a space-saving, folded drive train with the servo [...]
- August 24, 2007
SignalMeister Waveform Generator Software - Keithley Instruments
Keithley Instruments has released the SignalMeister, a free software tool to create waveform files that can be downloaded to Keithley's [...]
- August 21, 2007
Analog Automated Temperature Compensation Chip - Microbridge MBT-303-A Rejustor
Microbridge Technologies recently introduced new passive (analog) electronic Temperature Compensation (eTC) divider which called MBT-303-A rejustor (re-adjustable resistor). The new [...]
- August 16, 2007
DisplayPort Compliance Test Solution - Agilent
Agilent recently introduced its DisplayPort source compliance test solution. The new solution is designed for use by DisplayPort compliance test [...]
- August 15, 2007
HVMOS Extraction Package for IC-CAP Software Platform - Agilent
Agilent has released its new HVMOS extraction package, a parameter extraction solution for high voltage (HV) complementary metal oxide semiconductor [...]
- August 15, 2007
New PXIT Modules for Optical Transceiver Manufacturing - Agilent
Agilent introduced its new PXIT modules for optical transceiver manufacturing, offering a combined bit error ratio tester (BERT) and Digital [...]
- August 8, 2007
High-Resolution Nanopositioning and Scanning System - P-733.3CD - Physik Instrumente
Physik Instrumente (PI) introduced its new P-733.3CD, a high-resolution XYZ nano-positioning & scanning system designed for high resolution microscopy, materials [...]
- August 3, 2007
iVista High-Resolution Digital Microscope for Wafer-Level Testing - SUSS MicroTec
SUSS MicroTec has launched the iVista High-Resolution Digital Microscope, delivering high resolution and software tools necessary for wafer-level testing applications [...]
- July 23, 2007
Agilent WiMAX Optimization Solution for IEEE 802.16e-2005 (Mobile WiMAX)
Agilent announced its WiMAX Optimization Solution for IEEE 802.16e-2005 (also known as Mobile WiMAX or IEEE 802.16e), based on the [...]
- June 29, 2007
Verigy V93000 Nanoelectronics Solution for 65nm and Smaller Digital ICs
Verigy introduced the V93000 Nanoelectronics Digital solution, providing accurate diagnostic and parametric data for structural and functional test for wafer [...]
- June 27, 2007

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