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iVista High-Resolution Digital Microscope for Wafer-Level Testing - SUSS MicroTec

Posted in Instrumentation, Chip, Semiconductor
On Monday, July 23, 2007

SUSS MicroTec has launched the iVista High-Resolution Digital Microscope, delivering high resolution and software tools necessary for wafer-level testing applications like device characterization, reliability test and failure analysis.

Digital Microscope
iVista High-Resolution Digital Microscope



The iVista microscope allows the user to save the full-resolution image and the multi-view screen for documentation. It also provides accurate point-to-point measurement and navigation using standard objectives, which eliminates the need to buy additional objectives or auto-recognition adapters.

SUSS MicroTec is a supplier of production, process and test technology for the semiconductor industry. SUSS maintains its leadership position with over 7,000 systems installed worldwide. SUSS products include coating developing systems, 1X full-field lithography (1XFFL) systems, substrate bonders, flip-chip bonders and probe systems.

iVista microscope delivers images with sharpness comparable to a 16-megapixel, color CCD. This means that even the tiniest features are quickly and easily identifiable and up to 40x digital zooming provides more detail and not just a pixilated image.

The iVista microscope enables several additional software features in the SPECTRUM Vision System from SUSS. Multi-view allows the user to create several freely-defined regions that are magnified and displayed alongside the main view, enabling live observation of specified areas without losing the big picture. Multi-cam imaging displays a live image from a separate camera alongside the live image from the iVista microscope. The user can then, for example, monitor contact height with the view from the patented ContactView system while observing the position of the wafer and probe tips.

More info: High-Resolution Digital Microscope - iVista


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