In Circuit Test (ICT) System for Electronic Manufacturer - Medalist i1000 - Agilent Technologies

Agilent introduced the Medalist i1000 In-Circuit Test System for electronic manufacturer. The new in-circuit-tester is targeted for production line that need simple and fast testing, such as in high-volume digital consumer and personal computer motherboards production lines.

Agilent’s Medalist i1000 P In Circuit Test System

Agilent’s Medalist i1000 In-Circuit Test System features Agilent VTEP v2.0 vectorless test suite. VTEP v2.0 comprises the award-winning iVTEP and the new Network Parameter Measurement technology. This feature enhance the coverage of micro ball grid arrays, flip chips and power/ground pins.

Agilent’s Medalist i1000 S

Medalist i1000 In-Circuit Test System is compatible with most MDA fixtures, providing investment protection for manufacturers who wish to upgrade their existing MDAs to obtain greater test capabilities.

The GUI of Medalist i1000 In-Circuit Test System ensures that the system is easy to operate. The ICT’s AutoDebug feature slashes debugging time from days to a few hours, speeding time-to-market and boosting profitability for manufacturers. The Agilent Medalist i1000 also comes with an automatic node-guarding feature that eliminates the need for manual checks of schematics for guard points.

Medalist i1000 ICT offers users two fixture options. The first provides users with an affordable option that accepts a typical MDA-type fixture with cable connections. The second employs a vacuum-type fixture and a mechanical fixture lock-down system using electrical motors. This cable-less design provides fast fixture-swapping time while maintaining high signal integrity.

Two types of the Medalist i1000 ICT:

• #U9401A Medalist i1000 P
  • Maximum Node Count: 2240
  • Programmable Power Supply: 4 x 100Watts
  • Fixture Type: Press Down
  • Footprint: 0.72m2/6.67ft2
• $U9402A Medalist i1000 S
  • Maximum Node Count: 2240
  • Programmable Power Supply: 4 x 100Watts
  • Fixture Type: Vacuum
  • Footprint: 0.72m2/6.67ft2

Key features of Medalist i1000 In-Circuit Test System

• Easy to use, pre-defined graphical user interface shorten users learning curve
• The automatic debug feature slashes debugging time from days to just a few hours with the click of a button
• Increase test coverage through our award winning iVTEP and the new Network Parameter Measurement Technology.
• The automatic node-guarding feature eliminates the need for manual checks of schematics for guard points helps reduces overall debug time.
• Compatible with most MDA fixtures, this system provides investment protection for manufacturers who wish to upgrade their existing MDAs to obtain greater test capabilities. (Medalist i1000 P)
• The system uses break-thru fixture interface with a new recyclable, simple and low cost vacuum fixture to provide better signal quality, measurement stability and accuracy. (Medalist i1000 S)

Medalist i1000 In-Circuit Test System is scheduled to be available in June 2007, with prices starting at $45,000.

Source: Medalist i1000 In-Circuit Test System