In-Circuit PCB Test for Electronics Manufacturers - Agilent Medalist i3070

Agilent announced the availability of the it’s Medalist i3070 in-circuit PCB test system for Electronics Manufacturers. The Medalist i3070 includes VTEP v2.0 vectorless test technology for detection of defect occurs on power and ground pins. Power and ground pins have long been considered off limits to vectorless test. It is because, the power or ground pins are tied in common track, making an opening in a pin very difficult to be detected.

About Agilent Medalist ICT:
The Agilent Medalist ICT (In Circuit Test) family features a scalable and modular configurations to solve the widest variety of priorities on the production floor. Compatible design and ICT technology provide stability and repeatability, transportability, providing total freedom to migrate tests across systems and production lines.

Both the new Medalist i3070 and VTEP v2.0 capabilities can be enabled on existing Medalist ICT systems with a simple software upgrade. Concurrently, to further protect the investment of existing Agilent Medalist 3070 and i5000 users, the new Medalist i3070 provides a high degree of compatibility with the legacy Agilent ICT systems, making it effortless for end-users to transport across systems with the same configuration.

Source: Agilent Medalist ICT