Dynamic Memory Test Handler - Advantest M6241

Advantest announced the M6241, new dynamic test handler for memory devices such as DDR2/3-SDRAM. The new testing instrument is able to handle up to 512 devices and boasts a throughput of 20,000 units per hour.

Advantest’s M6241 Dynamic Memory Test Handler

The M6241 dynamic memory test handler is equipped with a new heating mechanism and takes just half the time of conventional models to reach target temperature. The new mechanism also controls temperature fluctuations between devices under test, resulting in an improvement to temperature stability of up to 17%.

Advantest’s M6241 dynamic memory test handler incorporates a new pitch conversion kit mechanism that affords increased test efficiency and extends the life of the system. The new M6241 also provides for a quick change-kit conversion between packages.

Key Specs of M6241 dynamic memory test handler

• Parallel Test Capacity: Up to 512 devices
• Target Packages: BGA, CSP, TSOP1, TSOP2 etc.
• Throughput: 20,000 devices / hour
• Temperature Range: -40 degrees C ~ 125 degrees C

Source: M6241 dynamic memory test handler  - Advantest