DSP Instruments for X-Series Test Systems - LTX

LTX Corporation announced a new suite of DSP (digital signal processing) instruments for its family of X-Series test systems. The new instruments, including a high speed arbitrary waveform generator (AWG) and high speed digitizer, incorporate LTX's proprietary digital processing technology.

Dave Tacelli, LTX, stated:

Our customers continue to increase device performance while at the same time driving down costs..

To provide test capabilities that address these dual requirements, LTX continually invests in the R&D necessary to bring to market the most powerful and cost effective test solutions. Our new DSP instrument suite is one such example, and we are excited to see several of our leading customers already using this technology to reduce costs while enhancing product yields…

The addition of these new instruments to LTX's portfolio of DSP options enables X-Series test systems to provide the fastest test times and highest test accuracy for a broad range of mixed signal applications, including RF wireless cellular, networking and gaming; analog and digital video; wireless and wired baseband; automotive infotainment; and portable and system power management.

LTX's new, high speed DSP options include:

• High Speed Arbitrary Waveform Generator (AWG-HSB) - The AWG-HSB is a dual channel, 16 Bit, 250 MSPS arbitrary waveform generator with enhanced SNR, offering high throughput and accuracy
• High Speed Waveform Digitizer (DIG-HSB) - The DIG-HSB is a dual channel, 14 Bit, 105 MSPS waveform digitizer offering high throughput and accuracy

LTX's full portfolio of DSP instruments is available for immediate delivery on all X-Series test systems, including the LX, CX, MX and EX configurations.

Further info: LTX’s  DSP Instruments for X-Series Test Systems